Assignee
CHISM II WILLIAM W
US·5 granted patents·1 pending application·23 citations·filing 2004–2022
Top patents by PatentIndex Score
6 records- 0187US10921369B2High precision optical characterization of carrier transport properties in semiconductorsCHISM II WILLIAM W·Filed 2017·Granted Feb 16, 2021·4 cites·20 claims
- 0278US8300227B2Method and apparatus of z-scan photoreflectance characterizationCHISM II WILLIAM W·Filed 2009·Granted Oct 30, 2012·7 cites·20 claims
- 0368US6963402B2Polarization modulation photoreflectance characterization of semiconductor quantum confined structuresCHISM II WILLIAM W·Filed 2004·Granted Nov 8, 2005·10 cites·26 claims
- 0462US12281992B1Systems and methods for voltage contrast imaging using photoreflectance microscopyCHISM II WILLIAM W·Filed 2022·Granted Apr 22, 2025·0 cites·14 claims
- 0546US2012327420A1Method and apparatus of z-scan photoreflectance characterizationCHISM II WILLIAM W·Filed 2012·Application pending·0 cites
- 0640US7122806B2Laser stimulated atom probe characterization of semiconductor and dielectric structuresCHISM II WILLIAM W·Filed 2004·Granted Oct 17, 2006·2 cites·27 claims
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