Assignee
CHENG MEI INSTR TECHNOLOGY CO LTD
TW·1 granted patent·3 pending applications·5 citations·filing 2009–2015
Top patents by PatentIndex Score
4 records- 0165US7878336B2System and method for inspection of chips on trayCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2009·Granted Feb 1, 2011·5 cites·14 claims
- 0231US2016047755A1Optical measuring apparatus and method for measuring patterned sapphire substrateCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2015·Application pending·0 cites
- 0331US2016047756A1Method for measuring patterned sapphire substrateCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2015·Application pending·0 cites
- 0431US2016047754A1Light deflection detection module and measurement and calibration method using the sameCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2015·Application pending·0 cites
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