Assignee
CHEN KWUN JONG
US·0 granted patents·3 pending applications·0 citations·filing 2014–2016
Top patents by PatentIndex Score
3 records- 0117US2015362548A1Wafer map identification system for wafer test dataCHEN KWUN JONG·Filed 2014·Application pending·0 cites
- 0216US2015235415A1Wafer test data analysis methodCHEN KWUN JONG·Filed 2014·Application pending·0 cites
- 037US2016266198A1Method for ic testing bigdata analysis option value analysisCHEN KWUN JONG·Filed 2016·Application pending·0 cites
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