Assignee
CHANG JIN-MAN
KR·2 granted patents·1 pending application·3 citations·filing 2008–2011
Top patents by PatentIndex Score
3 records- 0151US8624619B2Semiconductor device and method of performing electrical test on sameCHANG JIN-MAN·Filed 2010·Granted Jan 7, 2014·1 cites·20 claims
- 0249US8610277B2Bridge type pad structure of a semiconductor deviceCHANG JIN-MAN·Filed 2008·Granted Dec 17, 2013·2 cites·10 claims
- 0327US2012112364A1Wiring structure of semiconductor deviceCHANG JIN-MAN·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →