Assignee
CHANDRA KAUSHIK
US·2 granted patents·5 citations·filing 2007–2012
Technology mixH10W2
Top patents by PatentIndex Score
2 records- 0165US8716101B2Structure and method of reducing electromigration cracking and extrusion effects in semiconductor devicesCHANDRA KAUSHIK·Filed 2012·Granted May 6, 2014·2 cites·6 claims
- 0260US8237283B2Structure and method of reducing electromigration cracking and extrusion effects in semiconductor devicesCHANDRA KAUSHIK·Filed 2007·Granted Aug 7, 2012·3 cites·13 claims
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