Assignee

CHAN SOK LENG

SG·2 granted patents·5 citations·filing 2009–2009

Technology mixG01N2 H10F2 H10P2 G01R1 H01L1 H04N1

Top patents by PatentIndex Score

2 records

0160US8428337B2Apparatus for detecting micro-cracks in wafers and method thereforCHAN SOK LENG·Filed 2009·Granted Apr 23, 2013·4 cites·20 claims
0248US9651502B2Method and system for detecting micro-cracks in wafersCHAN SOK LENG·Filed 2009·Granted May 16, 2017·1 cites·25 claims

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