Assignee
CELADON SYSTEMS INC
US·37 granted patents·5 pending applications·281 citations·filing 1998–2025
Top patents by PatentIndex Score
42 records- 0194US6586954B2Probe tile for probing semiconductor waferCELADON SYSTEMS INC·Filed 2000·Granted Jul 1, 2003·54 cites·16 claims
- 0292US6963207B2Apparatus and method for terminating probe apparatus of semiconductor waferCELADON SYSTEMS INC·Filed 2003·Granted Nov 8, 2005·39 cites·17 claims
- 0386US6882168B2Probe tile for probing semiconductor waferCELADON SYSTEMS INC·Filed 2003·Granted Apr 19, 2005·23 cites·16 claims
- 0486US6201402B1Probe tile and platform for large area wafer probingCELADON SYSTEMS INC·Filed 1998·Granted Mar 13, 2001·49 cites·10 claims
- 0585US6975128B1Electrical, high temperature test probe with conductive driven guardCELADON SYSTEMS INC·Filed 2004·Granted Dec 13, 2005·23 cites·9 claims
- 0684US9726694B2Test systems with a probe apparatus and index mechanismCELADON SYSTEMS INC·Filed 2015·Granted Aug 8, 2017·2 cites·11 claims
- 0783US11275106B2High voltage probe card systemCELADON SYSTEMS INC·Filed 2019·Granted Mar 15, 2022·2 cites·20 claims
- 0881US7345494B2Probe tile for probing semiconductor waferCELADON SYSTEMS INC·Filed 2006·Granted Mar 18, 2008·7 cites·10 claims
- 0981US7170305B2Apparatus and method for terminating probe apparatus of semiconductor waferCELADON SYSTEMS INC·Filed 2005·Granted Jan 30, 2007·6 cites·7 claims
- 1079US7768282B2Apparatus and method for terminating probe apparatus of semiconductor waferCELADON SYSTEMS INC·Filed 2009·Granted Aug 3, 2010·5 cites·5 claims
- 1179US7148710B2Probe tile for probing semiconductor waferCELADON SYSTEMS INC·Filed 2005·Granted Dec 12, 2006·6 cites·1 claims
- 1277US6992495B2Shielded probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2003·Granted Jan 31, 2006·15 cites·16 claims
- 1376US10261124B2Modular rail systems, rail systems, mechanisms, and equipment for devices under testCELADON SYSTEMS INC·Filed 2016·Granted Apr 16, 2019·1 cites·28 claims
- 1475US7728609B2Replaceable probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2008·Granted Jun 1, 2010·6 cites·6 claims
- 1575US7626404B2Replaceable probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2005·Granted Dec 1, 2009·6 cites·3 claims
- 1674US9279829B2Apparatus and method for terminating probe apparatus of semiconductor waferCELADON SYSTEMS INC·Filed 2014·Granted Mar 8, 2016·1 cites·2 claims
- 1771US11313902B2Modular rail systems, rail systems, mechanisms, and equipment for devices under testCELADON SYSTEMS INC·Filed 2020·Granted Apr 26, 2022·0 cites·19 claims
- 1870US7259577B2Shielded probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2005·Granted Aug 21, 2007·4 cites·8 claims
- 1968US10620262B2Modular rail systems, rail systems, mechanisms, and equipment for devices under testCELADON SYSTEMS INC·Filed 2019·Granted Apr 14, 2020·0 cites·18 claims
- 2068USD639757STop contact layout board in an electrical systemCELADON SYSTEMS INC·Filed 2010·Granted Jun 14, 2011·15 cites·1 claims
- 2168US2024219423A1Portable probe card assemblyCELADON SYSTEMS INC·Filed 2024·Application pending·0 cites
- 2266US7956629B2Probe tile for probing semiconductor waferCELADON SYSTEMS INC·Filed 2010·Granted Jun 7, 2011·1 cites·12 claims
- 2366US7786743B2Probe tile for probing semiconductor waferCELADON SYSTEMS INC·Filed 2007·Granted Aug 31, 2010·3 cites·10 claims
- 2464US9910067B2Apparatus and method for terminating probe apparatus of semiconductor waferCELADON SYSTEMS INC·Filed 2016·Granted Mar 6, 2018·0 cites·3 claims
- 2563US10145863B2Test systems with a probe apparatus and index mechanismCELADON SYSTEMS INC·Filed 2017·Granted Dec 4, 2018·0 cites·13 claims
- 2662US2026029434A1Arc suppression in a wafer testing environmentCELADON SYSTEMS INC·Filed 2025·Application pending·0 cites
- 2759US10976347B2Magnet extensionCELADON SYSTEMS INC·Filed 2018·Granted Apr 13, 2021·0 cites·20 claims
- 2856US11933816B2Portable probe card assemblyCELADON SYSTEMS INC·Filed 2020·Granted Mar 19, 2024·0 cites·10 claims
- 2956US10295565B2Probe card with stress relieving featureCELADON SYSTEMS INC·Filed 2015·Granted May 21, 2019·0 cites·11 claims
- 3056US9678149B2Test apparatus having a probe core with a twist lock mechanismCELADON SYSTEMS INC·Filed 2014·Granted Jun 13, 2017·0 cites·15 claims
- 3155US10254309B2Test apparatus having a probe core with a latch mechanismCELADON SYSTEMS INC·Filed 2014·Granted Apr 9, 2019·0 cites·22 claims
- 3254US7545157B2Shielded probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2007·Granted Jun 9, 2009·1 cites·11 claims
- 3353USD639755STop contact layout board in an electrical systemCELADON SYSTEMS INC·Filed 2010·Granted Jun 14, 2011·8 cites·1 claims
- 3453US7271607B1Electrical, high temperature test probe with conductive driven guardCELADON SYSTEMS INC·Filed 2005·Granted Sep 18, 2007·1 cites·4 claims
- 3550US7999564B2Replaceable probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2010·Granted Aug 16, 2011·0 cites·6 claims
- 3648US8354856B2Replaceable probe apparatus for probing semiconductor waferCELADON SYSTEMS INC·Filed 2009·Granted Jan 15, 2013·0 cites·6 claims
- 3746US7659737B1Electrical, high temperature test probe with conductive driven guardCELADON SYSTEMS INC·Filed 2007·Granted Feb 9, 2010·0 cites·5 claims
- 3845US2007279075A1Apparatus and Method for Terminating Probe Apparatus of Semiconductor WaferCELADON SYSTEMS INC·Filed 2007·Application pending·0 cites
- 3945US2007087597A1Apparatus and Method for Terminating Probe Apparatus of Semiconductor WaferCELADON SYSTEMS INC·Filed 2006·Application pending·0 cites
- 4043US2005253612A1Apparatus and method for terminating probe apparatus of semiconductor waferCELADON SYSTEMS INC·Filed 2005·Application pending·0 cites
- 4136USD713363SSupport for a probe test coreCELADON SYSTEMS INC·Filed 2013·Granted Sep 16, 2014·3 cites·1 claims
- 4227USD722031STop contact layout board in an electrical systemCELADON SYSTEMS INC·Filed 2013·Granted Feb 3, 2015·0 cites·1 claims
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