Assignee
CANDELA INSTR
US·12 granted patents·565 citations·filing 1998–2003
Top patents by PatentIndex Score
12 records- 0197US6392749B1High speed optical profilometer for measuring surface height variationCANDELA INSTR·Filed 2000·Granted May 21, 2002·123 cites·28 claims
- 0296US6757056B1Combined high speed optical profilometer and ellipsometerCANDELA INSTR·Filed 2001·Granted Jun 29, 2004·91 cites·72 claims
- 0394US6031615ASystem and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughnessCANDELA INSTR·Filed 1998·Granted Feb 29, 2000·74 cites·93 claims
- 0489US6717671B1System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic patternCANDELA INSTR·Filed 1999·Granted Apr 6, 2004·48 cites·37 claims
- 0588US6268919B1System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operationsCANDELA INSTR·Filed 1999·Granted Jul 31, 2001·47 cites·36 claims
- 0686US6130749ASystem and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operationCANDELA INSTR·Filed 1999·Granted Oct 10, 2000·40 cites·29 claims
- 0784US6781103B1Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disksCANDELA INSTR·Filed 2003·Granted Aug 24, 2004·42 cites·41 claims
- 0882US6229610B1System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operationCANDELA INSTR·Filed 1999·Granted May 8, 2001·33 cites·36 claims
- 0977US6665078B1System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafersCANDELA INSTR·Filed 1999·Granted Dec 16, 2003·36 cites·34 claims
- 1074US7123357B2Method of detecting and classifying scratches and particles on thin film disks or wafersCANDELA INSTR·Filed 2003·Granted Oct 17, 2006·16 cites·1 claims
- 1165US6897957B2Material independent optical profilometerCANDELA INSTR·Filed 2001·Granted May 24, 2005·8 cites·8 claims
- 1264US6909500B2Method of detecting and classifying scratches, particles and pits on thin film disks or wafersCANDELA INSTR·Filed 2002·Granted Jun 21, 2005·7 cites·25 claims
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