Assignee
BINKHOFF PETER
DE·2 granted patents·0 citations·filing 2011–2011
Top patents by PatentIndex Score
2 records- 0131US8943907B2Method and device for measuring a microelectromechanical semiconductor componentBINKHOFF PETER·Filed 2011·Granted Feb 3, 2015·0 cites·13 claims
- 0224US9322731B2Method for measuring a microelectromechanical semiconductor componentBINKHOFF PETER·Filed 2011·Granted Apr 26, 2016·0 cites·13 claims
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