Assignee
BELTRONICS INC
US·14 granted patents·620 citations·filing 1982–2003
Top patents by PatentIndex Score
14 records- 0192US4589140AMethod of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the likeBELTRONICS INC·Filed 1983·Granted May 13, 1986·177 cites·32 claims
- 0291US4893346AApparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like, and methodBELTRONICS INC·Filed 1987·Granted Jan 9, 1990·118 cites·29 claims
- 0390US7015445B2Method for optimizing inspection speed in low, and fluorescent light applications without sacrificing signal to noise ratio, resolution, or focus qualityBELTRONICS INC·Filed 2003·Granted Mar 21, 2006·45 cites·7 claims
- 0483US6091488AMethod of and apparatus for automatic high-speed optical inspection of semi-conductor structures and the like through fluorescent photoresist inspectionBELTRONICS INC·Filed 1999·Granted Jul 18, 2000·67 cites·20 claims
- 0578US6014209AMethod of optically inspecting multi-layered electronic parts and the like with fluorescent scattering top layer discrimination and apparatus thereforBELTRONICS INC·Filed 1997·Granted Jan 11, 2000·51 cites·12 claims
- 0669US5524152AMethod of and apparatus for object or surface inspection employing multicolor reflection discriminationBELTRONICS INC·Filed 1994·Granted Jun 4, 1996·31 cites·18 claims
- 0768US6603877B1Method of and apparatus for optical imaging inspection of multi-material objects and the likeBELTRONICS INC·Filed 1999·Granted Aug 5, 2003·43 cites·39 claims
- 0859US6427024B1Apparatus for and method of automatic optical inspection of electronic circuit boards, wafers and the like for defects, using skeletal reference inspection and separately programmable alignment tolerance and detection parametersBELTRONICS INC·Filed 1999·Granted Jul 30, 2002·30 cites·47 claims
- 0955US5119434AMethod of and apparatus for geometric pattern inspection employing intelligent imaged-pattern shrinking, expanding and processing to identify predetermined features and tolerancesBELTRONICS INC·Filed 1990·Granted Jun 2, 1992·25 cites·38 claims
- 1047US5046120AMethod of and apparatus for increasing the processing speed in the scanning inspection of circuit boards and other objectsBELTRONICS INC·Filed 1989·Granted Sep 3, 1991·17 cites·11 claims
- 1142US4484225AElectronic focusing method and apparatus for television pick-up cameras and the likeBELTRONICS INC·Filed 1982·Granted Nov 20, 1984·6 cites·10 claims
- 1238US4697088AMethod of and apparatus for discriminating sharp edge transitions produced during optical scanning of differently reflective regionsBELTRONICS INC·Filed 1985·Granted Sep 29, 1987·7 cites·6 claims
- 1329US4649424AGrounding system for CCD imaging apparatus and the likeBELTRONICS INC·Filed 1985·Granted Mar 10, 1987·1 cites·3 claims
- 1427US4537505AMethod for detecting pin holes and the like in sheet material for packaging and similar applicationsBELTRONICS INC·Filed 1982·Granted Aug 27, 1985·2 cites·5 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →