Assignee
BALOG GIL
IL·2 granted patents·1 pending application·9 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0179US8421494B2Systems and methods for test time outlier detection and correction in integrated circuit testingBALOG GIL·Filed 2011·Granted Apr 16, 2013·3 cites·18 claims
- 0275US8069130B2Methods and systems for semiconductor testing using a testing scenario languageBALOG GIL·Filed 2009·Granted Nov 29, 2011·6 cites·19 claims
- 0343US2012109874A1Methods and systems for semiconductor testing using a testing scenario languageBALOG GIL·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →