Assignee
ATEQ CORP
US·12 granted patents·3 pending applications·526 citations·filing 1985–2023
Top patents by PatentIndex Score
15 records- 0197US4796038ALaser pattern generation apparatusATEQ CORP·Filed 1988·Granted Jan 3, 1989·254 cites·28 claims
- 0293US9050862B2Universal tire pressure monitoring system tool and methodsATEQ CORP·Filed 2012·Granted Jun 9, 2015·27 cites·9 claims
- 0392US9539866B2High volume vehicle inspection system and methodsATEQ CORP·Filed 2013·Granted Jan 10, 2017·21 cites·8 claims
- 0489US4879605ARasterization system utilizing an overlay of bit-mapped low address resolution databasesATEQ CORP·Filed 1988·Granted Nov 7, 1989·101 cites·23 claims
- 0588US11187752B2Battery leak test device and methodsATEQ CORP·Filed 2019·Granted Nov 30, 2021·6 cites·30 claims
- 0687US4797696ABeam splitting apparatusATEQ CORP·Filed 1987·Granted Jan 10, 1989·50 cites·14 claims
- 0784US10675926B2High volume vehicle inspection system and methodsATEQ CORP·Filed 2016·Granted Jun 9, 2020·2 cites·20 claims
- 0878US4806921ARasterizer for pattern generatorATEQ CORP·Filed 1985·Granted Feb 21, 1989·40 cites·25 claims
- 0972US10473549B2Fluid leak measurement test device and methodsATEQ CORP·Filed 2017·Granted Nov 12, 2019·2 cites·15 claims
- 1071US4956650APattern generation systemATEQ CORP·Filed 1988·Granted Sep 11, 1990·23 cites·11 claims
- 1167US11693057B2Battery leak test device and methodsATEQ CORP·Filed 2021·Granted Jul 4, 2023·0 cites·20 claims
- 1257US2023260296A1Tire Pressure Monitoring System Tool (TPMS) With Tire Indicia RecognitionATEQ CORP·Filed 2023·Application pending·0 cites
- 1353US12596052B2Apparatus and method for automatic leak detectionATEQ CORP·Filed 2021·Granted Apr 7, 2026·0 cites·15 claims
- 1444US2014139332A1Vehicle tire and brake inspection toolATEQ CORP·Filed 2013·Application pending·0 cites
- 1542US2013145834A1Universal tire pressure monitoring system tool and absolute pressure compensationATEQ CORP·Filed 2012·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →