Assignee
APPLEJACK 199 LP
US·29 granted patents·9 pending applications·45 citations·filing 2013–2021
Top patents by PatentIndex Score
38 records- 0190US10209058B1Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2018·Granted Feb 19, 2019·5 cites·16 claims
- 0289US9915564B1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2017·Granted Mar 13, 2018·7 cites·20 claims
- 0388US9478797B2System, method and apparatus for forming a thin film lithium ion batteryAPPLEJACK 199 LP·Filed 2013·Granted Oct 25, 2016·4 cites·15 claims
- 0485US10113860B1Inspecting a multilayer sampleAPPLEJACK 199 LP·Filed 2017·Granted Oct 30, 2018·4 cites·17 claims
- 0582US10416430B2Focusing of optical devicesAPPLEJACK 199 LP·Filed 2017·Granted Sep 17, 2019·3 cites·25 claims
- 0681US10480925B2Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Nov 19, 2019·1 cites·15 claims
- 0779US10203198B2Measurement of surface topography of a work-pieceAPPLEJACK 199 LP·Filed 2017·Granted Feb 12, 2019·2 cites·25 claims
- 0878US10535868B2System, method and apparatus for forming a thin film lithium ion batteryAPPLEJACK 199 LP·Filed 2016·Granted Jan 14, 2020·1 cites·14 claims
- 0973US10551163B2Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2019·Granted Feb 4, 2020·1 cites·19 claims
- 1073US9457229B2Sensor-based gaming system for an avatar to represent a player in a virtual environmentAPPLEJACK 199 LP·Filed 2014·Granted Oct 4, 2016·7 cites·18 claims
- 1172US10563975B1Dual-sensor arrangment for inspecting slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Feb 18, 2020·1 cites·20 claims
- 1272US10036624B1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Jul 31, 2018·1 cites·20 claims
- 1371US10655949B2Inspecting a multilayer sampleAPPLEJACK 199 LP·Filed 2018·Granted May 19, 2020·1 cites·19 claims
- 1471US10553623B2Non-contact measurement of a stress in a film on a substrateAPPLEJACK 199 LP·Filed 2017·Granted Feb 4, 2020·1 cites·8 claims
- 1571US9272199B2System, method and apparatus for capturing and training a swing movement of a clubAPPLEJACK 199 LP·Filed 2013·Granted Mar 1, 2016·5 cites·14 claims
- 1670US2020266427A1Hybrid silicon-metal anode using microparticles for lithium-ion batteriesAPPLEJACK 199 LP·Filed 2020·Application pending·0 cites
- 1765US10593934B2Hybrid silicon-metal anode using microparticles for lithium-ion batteriesAPPLEJACK 199 LP·Filed 2017·Granted Mar 17, 2020·0 cites·9 claims
- 1863US2020182607A1Dual-sensor arrangment for inspecting slab of materialAPPLEJACK 199 LP·Filed 2020·Application pending·0 cites
- 1962US10533841B2Measurement of surface topography of a work-pieceAPPLEJACK 199 LP·Filed 2019·Granted Jan 14, 2020·0 cites·20 claims
- 2062US2020191550A1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2019·Application pending·0 cites
- 2162US2020320724A1Characterization of specular surfacesAPPLEJACK 199 LP·Filed 2020·Application pending·0 cites
- 2261US11163144B2Focusing of optical devicesAPPLEJACK 199 LP·Filed 2021·Granted Nov 2, 2021·0 cites·20 claims
- 2361US10935777B2Focusing of optical devicesAPPLEJACK 199 LP·Filed 2019·Granted Mar 2, 2021·0 cites·20 claims
- 2460US9316490B2Method and system for measuring patterned substratesAPPLEJACK 199 LP·Filed 2014·Granted Apr 19, 2016·1 cites·18 claims
- 2559US11073372B2Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2020·Granted Jul 27, 2021·0 cites·12 claims
- 2659US10964730B2Non-contact measurement of a stress in a film on a substrateAPPLEJACK 199 LP·Filed 2020·Granted Mar 30, 2021·0 cites·11 claims
- 2758US10168138B1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Jan 1, 2019·0 cites·20 claims
- 2856US10621739B2Characterization of specular surfacesAPPLEJACK 199 LP·Filed 2018·Granted Apr 14, 2020·0 cites·16 claims
- 2954US11112234B2Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2020·Granted Sep 7, 2021·0 cites·10 claims
- 3053US2015343293A1Measuring device for detecting a hitting movement of a hitting implement, training device, and method for training a hitting movementAPPLEJACK 199 LP·Filed 2013·Application pending·0 cites
- 3150US9748569B2Porous, thin film electrodes for lithium-ion batteriesAPPLEJACK 199 LP·Filed 2013·Granted Aug 29, 2017·0 cites·11 claims
- 3245US10584958B2Error reduction in measurement of samples of materialsAPPLEJACK 199 LP·Filed 2018·Granted Mar 10, 2020·0 cites·22 claims
- 3344US10890434B2Inspecting a multilayer sampleAPPLEJACK 199 LP·Filed 2018·Granted Jan 12, 2021·0 cites·20 claims
- 3441US2019243148A1Optical device employing electrically addressed spatial light modulatorAPPLEJACK 199 LP·Filed 2018·Application pending·0 cites
- 3540US11105611B2Non-contact measurement of a stress in a film on substrateAPPLEJACK 199 LP·Filed 2018·Granted Aug 31, 2021·0 cites·14 claims
- 3638US2015323313A1Stress analysis of semiconductor wafersAPPLEJACK 199 LP·Filed 2015·Application pending·0 cites
- 3736US2016070296A1Wearable devicesAPPLEJACK 199 LP·Filed 2015·Application pending·0 cites
- 3833US2016334205A1InterferometerAPPLEJACK 199 LP·Filed 2015·Application pending·0 cites
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