Individual holder
AGARWAL KANAK B
US·25 granted patents·2 pending applications·268 citations·filing 2007–2012
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
27 records- 0197US8647893B1Method for post decomposition density balancing in integrated circuit layouts, related system and program productAGARWAL KANAK B·Filed 2012·Granted Feb 11, 2014·34 cites·20 claims
- 0297US8103983B2Electrically-driven optical proximity correction to compensate for non-optical effectsAGARWAL KANAK B·Filed 2008·Granted Jan 24, 2012·104 cites·20 claims
- 0394US8146026B2Simultaneous photolithographic mask and target optimizationAGARWAL KANAK B·Filed 2009·Granted Mar 27, 2012·18 cites·20 claims
- 0491US8415077B2Simultaneous optical proximity correction and decomposition for double exposure lithographyAGARWAL KANAK B·Filed 2010·Granted Apr 9, 2013·7 cites·16 claims
- 0591US8321818B2Model-based retargeting of layout patterns for sub-wavelength photolithographyAGARWAL KANAK B·Filed 2009·Granted Nov 27, 2012·13 cites·20 claims
- 0691US8230372B2Retargeting for electrical yield enhancementAGARWAL KANAK B·Filed 2009·Granted Jul 24, 2012·11 cites·18 claims
- 0789US8627244B2Frequency domain layout decomposition in double patterning lithographyAGARWAL KANAK B·Filed 2011·Granted Jan 7, 2014·6 cites·20 claims
- 0889US8618960B1Selective recompression of a string compressed by a plurality of diverse lossless compression techniquesAGARWAL KANAK B·Filed 2012·Granted Dec 31, 2013·10 cites·14 claims
- 0989US8331646B2Optical proximity correction for transistors using harmonic mean of gate lengthAGARWAL KANAK B·Filed 2009·Granted Dec 11, 2012·10 cites·20 claims
- 1087US8824569B2High bandwidth decompression of variable length encoded data streamsAGARWAL KANAK B·Filed 2011·Granted Sep 2, 2014·9 cites·13 claims
- 1184US8154309B2Configurable PSRO structure for measuring frequency dependent capacitive loadsAGARWAL KANAK B·Filed 2009·Granted Apr 10, 2012·12 cites·14 claims
- 1282US8120356B2Measurement methodology and array structure for statistical stress and test of reliabilty structuresAGARWAL KANAK B·Filed 2009·Granted Feb 21, 2012·11 cites·25 claims
- 1378US8674856B2Data compression utilizing longest common subsequence templateAGARWAL KANAK B·Filed 2012·Granted Mar 18, 2014·5 cites·16 claims
- 1476US8151240B2Effective gate length circuit modeling based on concurrent length and mobility analysisAGARWAL KANAK B·Filed 2009·Granted Apr 3, 2012·6 cites·14 claims
- 1572US8217671B2Parallel array architecture for constant current electro-migration stress testingAGARWAL KANAK B·Filed 2009·Granted Jul 10, 2012·6 cites·19 claims
- 1671US8495530B2Retargeting for electrical yield enhancementAGARWAL KANAK B·Filed 2012·Granted Jul 23, 2013·1 cites·15 claims
- 1769US8136079B2Effective gate length circuit modeling based on concurrent length and mobility analysisAGARWAL KANAK B·Filed 2011·Granted Mar 13, 2012·2 cites·6 claims
- 1863US8830714B2High speed large scale dictionary matchingAGARWAL KANAK B·Filed 2012·Granted Sep 9, 2014·1 cites·22 claims
- 1956US8640062B2Rapid estimation of temperature rise in wires due to Joule heatingAGARWAL KANAK B·Filed 2011·Granted Jan 28, 2014·1 cites·19 claims
- 2055US9507250B2Optical proximity correction for improved electrical characteristicsAGARWAL KANAK B·Filed 2009·Granted Nov 29, 2016·0 cites·20 claims
- 2155US8804852B2High bandwidth decompression of variable length encoded data streamsAGARWAL KANAK B·Filed 2012·Granted Aug 12, 2014·1 cites·20 claims
- 2250US8782573B2Solutions for retargeting integrated circuit layouts based on diffraction pattern analysisAGARWAL KANAK B·Filed 2012·Granted Jul 15, 2014·0 cites·20 claims
- 2347US2009164155A1Method and system for isolating dopant fluctuation and device length variation from statistical measurements of threshold voltageAGARWAL KANAK B·Filed 2007·Application pending·0 cites
- 2446US8862426B2Method and test system for fast determination of parameter variation statisticsAGARWAL KANAK B·Filed 2007·Granted Oct 14, 2014·0 cites·3 claims
- 2545US8903715B2High bandwidth parsing of data encoding languagesAGARWAL KANAK B·Filed 2012·Granted Dec 2, 2014·0 cites·22 claims
- 2645US2008278182A1Test Structure for Statistical Characterization of Metal and Contact/Via ResistancesAGARWAL KANAK B·Filed 2007·Application pending·0 cites
- 2744US8402398B2Reducing through process delay variation in metal wiresAGARWAL KANAK B·Filed 2011·Granted Mar 19, 2013·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when AGARWAL KANAK B files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →