Assignee
ADVANCED VISION PARTICLE MEASU
US·2 granted patents·23 citations·filing 2001–2002
Top patents by PatentIndex Score
2 records- 0164US6629010B2Control feedback system and method for bulk material industrial processes using automated object or particle analysisADVANCED VISION PARTICLE MEASU·Filed 2001·Granted Sep 30, 2003·19 cites·20 claims
- 0245US6885904B2Control feedback system and method for bulk material industrial processes using automated object or particle analysisADVANCED VISION PARTICLE MEASU·Filed 2002·Granted Apr 26, 2005·4 cites·24 claims
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