Assignee
ADVANCED INQUIRY SYSTEMS INC
US·26 granted patents·3 pending applications·227 citations·filing 2006–2014
Top patents by PatentIndex Score
29 records- 0196US7456643B2Methods for multi-modal wafer testing using edge-extended wafer translatorADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Nov 25, 2008·29 cites·9 claims
- 0292US7489148B2Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translatorADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Feb 10, 2009·18 cites·9 claims
- 0392US7459924B2Apparatus for providing electrical access to one or more pads of the wafer using a wafer translator and a gasketADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Dec 2, 2008·18 cites·9 claims
- 0492US7453277B2Apparatus for full-wafer test and burn-in mechanismADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Nov 18, 2008·17 cites·10 claims
- 0591US7791174B2Wafer translator having a silicon core isolated from signal paths by a ground planeADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Sep 7, 2010·22 cites·15 claims
- 0691US7532022B2Apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted May 12, 2009·15 cites·11 claims
- 0791US7532021B2Apparatus for translated wafer stand-in testerADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted May 12, 2009·17 cites·5 claims
- 0886US8872533B2Wafer testing system and associated methods of use and manufactureADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Oct 28, 2014·5 cites·11 claims
- 0986US7579852B2Wafer translator having metallization pattern providing high density interdigitated contact pads for componentADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Aug 25, 2009·13 cites·12 claims
- 1084US7724008B2Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted May 25, 2010·10 cites·7 claims
- 1182US7379641B1Fiber-based optical alignment systemADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted May 27, 2008·8 cites·18 claims
- 1280US7723980B2Fully tested wafers having bond pads undamaged by probing and applications thereofADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted May 25, 2010·7 cites·7 claims
- 1377US7960986B2Methods and apparatus for multi-modal wafer testingADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Jun 14, 2011·6 cites·14 claims
- 1477US7498800B1Methods and apparatus for rotationally accessed tester interfaceADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Mar 3, 2009·12 cites·15 claims
- 1574US7572132B2Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2007·Granted Aug 11, 2009·9 cites·12 claims
- 1670US8779789B2Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methodsADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Jul 15, 2014·2 cites·19 claims
- 1769US7786745B2Method and apparatus for single-sided extension of electrical conductors beyond the edges of a substrateADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Aug 31, 2010·9 cites·10 claims
- 1868US8889526B2Apparatus for thinning, testing and singulating a semiconductor waferADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Nov 18, 2014·1 cites·16 claims
- 1966US7719298B2Full-wafer test and burn-in mechanismADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted May 18, 2010·3 cites·14 claims
- 2059US7724018B2Methods and apparatus for translated wafer stand-in testerADVANCED INQUIRY SYSTEMS INC·Filed 2009·Granted May 25, 2010·2 cites·10 claims
- 2159US7638366B2Methods and apparatus for addition of electrical conductors to previously fabricated deviceADVANCED INQUIRY SYSTEMS INC·Filed 2006·Granted Dec 29, 2009·1 cites·15 claims
- 2258US7460752B2Fiber-based optical alignment systemADVANCED INQUIRY SYSTEMS INC·Filed 2008·Granted Dec 2, 2008·1 cites·7 claims
- 2358US2015293171A1Methods and apparatus for thinning, testing and singulating a semiconductor waferADVANCED INQUIRY SYSTEMS INC·Filed 2014·Application pending·0 cites
- 2458US2014347086A1Method and apparatus for multi-planar edge-extended wafer translatorADVANCED INQUIRY SYSTEMS INC·Filed 2014·Application pending·0 cites
- 2557US8697456B2Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Apr 15, 2014·0 cites·15 claims
- 2650US9146269B2Maintaining a wafer/wafer translator pair in an attached state free of a gasket diposedADVANCED INQUIRY SYSTEMS INC·Filed 2013·Granted Sep 29, 2015·0 cites·23 claims
- 2750US8362797B2Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebetweenADVANCED INQUIRY SYSTEMS INC·Filed 2009·Granted Jan 29, 2013·1 cites·10 claims
- 2844US7786724B1Methods and apparatus for collecting process characterization data after first failure in a group of tested devicesADVANCED INQUIRY SYSTEMS INC·Filed 2009·Granted Aug 31, 2010·1 cites·10 claims
- 2941US2009224410A1Wafer translator having a silicon core fabricated with printed circuit board manufacturing techniquesADVANCED INQUIRY SYSTEMS INC·Filed 2008·Application pending·0 cites
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