Assignee
ACERIS 3D INSPECTION INC
CA·2 granted patents·17 citations·filing 2005–2007
Top patents by PatentIndex Score
2 records- 0186US7551272B2Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an objectACERIS 3D INSPECTION INC·Filed 2005·Granted Jun 23, 2009·16 cites·24 claims
- 0261US7535560B2Method and system for the inspection of integrated circuit devices having leadsACERIS 3D INSPECTION INC·Filed 2007·Granted May 19, 2009·1 cites·16 claims
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