Assignee
3D AT DEPTH INC
US·12 granted patents·4 pending applications·55 citations·filing 2018–2024
Top patents by PatentIndex Score
16 records- 0195US11774586B2Underwater optical metrology system3D AT DEPTH INC·Filed 2021·Granted Oct 3, 2023·3 cites·20 claims
- 0294US10871567B2Underwater optical positioning systems and methods3D AT DEPTH INC·Filed 2018·Granted Dec 22, 2020·13 cites·33 claims
- 0393US10698112B2Systems and methods for monitoring underwater structures3D AT DEPTH INC·Filed 2019·Granted Jun 30, 2020·8 cites·30 claims
- 0492US11125875B2Underwater optical metrology system3D AT DEPTH INC·Filed 2019·Granted Sep 21, 2021·7 cites·30 claims
- 0590US11249193B2Systems and methods for monitoring underwater structures3D AT DEPTH INC·Filed 2018·Granted Feb 15, 2022·5 cites·22 claims
- 0690US10545233B1Underwater optical metrology system3D AT DEPTH INC·Filed 2019·Granted Jan 28, 2020·9 cites·22 claims
- 0790US10502829B2Underwater optical metrology system3D AT DEPTH INC·Filed 2018·Granted Dec 10, 2019·9 cites·20 claims
- 0889US12019159B2Systems and methods for monitoring underwater structures3D AT DEPTH INC·Filed 2022·Granted Jun 25, 2024·1 cites·20 claims
- 0987US2025199169A1Underwater optical metrology system3D AT DEPTH INC·Filed 2024·Application pending·0 cites
- 1087US2025138185A1Underwater optical positioning systems and methods3D AT DEPTH INC·Filed 2024·Application pending·0 cites
- 1186US12585019B2Systems and methods for monitoring underwater structures3D AT DEPTH INC·Filed 2024·Granted Mar 24, 2026·0 cites·22 claims
- 1283US12146951B2Underwater optical metrology system3D AT DEPTH INC·Filed 2023·Granted Nov 19, 2024·0 cites·20 claims
- 1372US12169240B2Underwater optical positioning systems and methods3D AT DEPTH INC·Filed 2020·Granted Dec 17, 2024·0 cites·18 claims
- 1462US2024111031A1Laser inspection and measurement systems and methods3D AT DEPTH INC·Filed 2023·Application pending·0 cites
- 1559US2024329221A1OPTIMIZED MONOSTATIC LiDAR3D AT DEPTH INC·Filed 2024·Application pending·0 cites
- 1643US12347575B2Systems and methods for laser inspection and measurements3D AT DEPTH INC·Filed 2021·Granted Jul 1, 2025·0 cites·24 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →