Assignee
YOKOGAWA SHINJI
JP·2 granted patents·1 pending application·17 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0177US8161428B2Method of predicting reliability of semiconductor device, reliability prediction system using the same and storage medium storing program causing computer to execute the sameYOKOGAWA SHINJI·Filed 2009·Granted Apr 17, 2012·11 cites·15 claims
- 0271US8209651B2Wiring layout decision method of integrated circuitYOKOGAWA SHINJI·Filed 2009·Granted Jun 26, 2012·6 cites·10 claims
- 0335US2012025403A1Design apparatus of semiconductor device, design method of semiconductor device, and semiconductor deviceYOKOGAWA SHINJI·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →