Assignee
XIE RUILONG
US·14 granted patents·1 pending application·278 citations·filing 2011–2012
Top patents by PatentIndex Score
15 records- 0199US8524592B1Methods of forming semiconductor devices with self-aligned contacts and low-k spacers and the resulting devicesXIE RUILONG·Filed 2012·Granted Sep 3, 2013·70 cites·18 claims
- 0297US8772168B2Formation of the dielectric cap layer for a replacement gate structureXIE RUILONG·Filed 2012·Granted Jul 8, 2014·34 cites·7 claims
- 0397US8541274B1Methods of forming 3-D semiconductor devices with a nanowire gate structure wherein the nanowire gate structure is formed after source/drain formationXIE RUILONG·Filed 2012·Granted Sep 24, 2013·39 cites·15 claims
- 0495US8580634B1Methods of forming 3-D semiconductor devices with a nanowire gate structure wherein the nanowire gate structure is formed prior to source/drain formationXIE RUILONG·Filed 2012·Granted Nov 12, 2013·22 cites·19 claims
- 0594US8753970B2Methods of forming semiconductor devices with self-aligned contacts and the resulting devicesXIE RUILONG·Filed 2012·Granted Jun 17, 2014·24 cites·13 claims
- 0693US8617973B2Semiconductor device fabrication methods with enhanced control in recessing processesXIE RUILONG·Filed 2011·Granted Dec 31, 2013·14 cites·20 claims
- 0793US8609480B2Methods of forming isolation structures on FinFET semiconductor devicesXIE RUILONG·Filed 2011·Granted Dec 17, 2013·12 cites·19 claims
- 0892US8679909B2Recessing and capping of gate structures with varying metal compositionsXIE RUILONG·Filed 2012·Granted Mar 25, 2014·14 cites·15 claims
- 0992US8679968B2Method for forming a self-aligned contact opening by a lateral etchXIE RUILONG·Filed 2012·Granted Mar 25, 2014·19 cites·20 claims
- 1090US9147765B2FinFET semiconductor devices with improved source/drain resistance and methods of making sameXIE RUILONG·Filed 2012·Granted Sep 29, 2015·10 cites·19 claims
- 1184US8728908B2Methods of forming a dielectric cap layer on a metal gate structureXIE RUILONG·Filed 2011·Granted May 20, 2014·9 cites·23 claims
- 1283US8940626B2Integrated circuit and method for fabricating the same having a replacement gate structureXIE RUILONG·Filed 2012·Granted Jan 27, 2015·9 cites·5 claims
- 1374US8748309B2Integrated circuits with improved gate uniformity and methods for fabricating sameXIE RUILONG·Filed 2012·Granted Jun 10, 2014·2 cites·18 claims
- 1443US8936979B2Semiconductor devices having improved gate height uniformity and methods for fabricating sameXIE RUILONG·Filed 2012·Granted Jan 20, 2015·0 cites·17 claims
- 1539US2013187236A1Methods of Forming Replacement Gate Structures for Semiconductor DevicesXIE RUILONG·Filed 2012·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →