Assignee
XCERRA CORP
US·21 granted patents·16 pending applications·21 citations·filing 2013–2024
Top patents by PatentIndex Score
37 records- 0191US10037933B2Test socket assembly and related methodsXCERRA CORP·Filed 2015·Granted Jul 31, 2018·8 cites·22 claims
- 0283US9829506B2Test probe assembly and related methodsXCERRA CORP·Filed 2013·Granted Nov 28, 2017·7 cites·22 claims
- 0374US11268981B2Spring-loaded probe having folded portions and probe assemblyXCERRA CORP·Filed 2017·Granted Mar 8, 2022·2 cites·30 claims
- 0472US9720032B2Automated test platform for testing short circuitsXCERRA CORP·Filed 2015·Granted Aug 1, 2017·2 cites·19 claims
- 0571US12498395B2System and method for attenuating and/or terminating RF circuitXCERRA CORP·Filed 2023·Granted Dec 16, 2025·0 cites·19 claims
- 0664US11650227B2System and method for attenuating and/or terminating RF circuitXCERRA CORP·Filed 2021·Granted May 16, 2023·0 cites·3 claims
- 0763US9343830B1Integrated circuit chip tester with embedded micro linkXCERRA CORP·Filed 2015·Granted May 17, 2016·2 cites·11 claims
- 0862US2026086152A1Method and apparatus for monitoring overcurrent conditions in switches for semiconductor device testingXCERRA CORP·Filed 2024·Application pending·0 cites
- 0962US2026092971A1Method and apparatus for determining settling of analog signal in semiconductor device testingXCERRA CORP·Filed 2024·Application pending·0 cites
- 1061US12334988B2Reflective and interference controlled absorptive contactorXCERRA CORP·Filed 2021·Granted Jun 17, 2025·0 cites·20 claims
- 1160US11774495B2Capacitive test needle for measuring electrically conductive layers in printed circuit board holesXCERRA CORP·Filed 2019·Granted Oct 3, 2023·0 cites·8 claims
- 1257US10444278B2Testing system and methodXCERRA CORP·Filed 2017·Granted Oct 15, 2019·0 cites·20 claims
- 1357US2026086150A1Composite system design for common mode error correctionXCERRA CORP·Filed 2024·Application pending·0 cites
- 1456US2025321247A1Replaceable insulator collars for semiconductor test systemsXCERRA CORP·Filed 2024·Application pending·0 cites
- 1554US2025314695A1Test probe assembly for high frequency device characterizationXCERRA CORP·Filed 2024·Application pending·0 cites
- 1652US12123897B2Dielectric resonating test contactor and methodXCERRA CORP·Filed 2020·Granted Oct 22, 2024·0 cites·17 claims
- 1752US2015316609A1Debugging system and methodXCERRA CORP·Filed 2015·Application pending·0 cites
- 1852US2015316608A1Debugging system and methodXCERRA CORP·Filed 2015·Application pending·0 cites
- 1952US2015316614A1Debugging system and methodXCERRA CORP·Filed 2015·Application pending·0 cites
- 2052US2015316611A1Debugging system and methodXCERRA CORP·Filed 2015·Application pending·0 cites
- 2152US2015316610A1Debugging system and methodXCERRA CORP·Filed 2015·Application pending·0 cites
- 2251US12044726B2Calibration systemXCERRA CORP·Filed 2021·Granted Jul 23, 2024·0 cites·27 claims
- 2351US11662363B2Test socket assembly with antenna and related methodsXCERRA CORP·Filed 2018·Granted May 30, 2023·0 cites·2 claims
- 2451US11088051B2Test socket assembly and related methodsXCERRA CORP·Filed 2017·Granted Aug 10, 2021·0 cites·22 claims
- 2551US11041881B2Hybrid probe head assembly for testing a wafer device under testXCERRA CORP·Filed 2019·Granted Jun 22, 2021·0 cites·19 claims
- 2651US10379154B2Testing system and methodXCERRA CORP·Filed 2017·Granted Aug 13, 2019·0 cites·16 claims
- 2750US2018128873A1Multi-node testing system and methodXCERRA CORP·Filed 2017·Application pending·0 cites
- 2850US2018128872A1Multi-node testing system and methodXCERRA CORP·Filed 2017·Application pending·0 cites
- 2947US12111343B2Coaxial probeXCERRA CORP·Filed 2020·Granted Oct 8, 2024·0 cites·20 claims
- 3047US9753058B2Wiring board for testing loaded printed circuit boardXCERRA CORP·Filed 2014·Granted Sep 5, 2017·0 cites·16 claims
- 3146US11391765B2Test socket assembly with waveguide antenna probeXCERRA CORP·Filed 2020·Granted Jul 19, 2022·0 cites·20 claims
- 3244US11061065B2Testing device and method for testing a printed circuit boardXCERRA CORP·Filed 2018·Granted Jul 13, 2021·0 cites·17 claims
- 3336US2018095110A1Compact testing systemXCERRA CORP·Filed 2016·Application pending·0 cites
- 3436US2020116759A1Test probe assembly for high frequency device characterizationXCERRA CORP·Filed 2019·Application pending·0 cites
- 3535US2018217200A1Positioning device for a parallel tester for testing printed circuit boards and parallel tester for testing printed circuit boardsXCERRA CORP·Filed 2016·Application pending·0 cites
- 3634US2020083582A1High frequency circuit with radar absorbing material termination component and related methodsXCERRA CORP·Filed 2019·Application pending·0 cites
- 3733US10101360B2Link socket sliding mount with preloadXCERRA CORP·Filed 2016·Granted Oct 16, 2018·0 cites·4 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →