Assignee
WILBY ROBERT JOHN
GB·4 granted patents·24 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0183US8200447B2Measuring apparatusWILBY ROBERT JOHN·Filed 2011·Granted Jun 12, 2012·7 cites·12 claims
- 0282US8683880B2Semiconductor wafer metrology apparatus and methodWILBY ROBERT JOHN·Filed 2008·Granted Apr 1, 2014·7 cites·3 claims
- 0378US8200353B2Measuring apparatusWILBY ROBERT JOHN·Filed 2008·Granted Jun 12, 2012·6 cites·21 claims
- 0471US9349624B2Semiconductor wafer monitoring apparatus and methodWILBY ROBERT JOHN·Filed 2009·Granted May 24, 2016·4 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when WILBY ROBERT JOHN files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →