Assignee
TOYOSHIMA HIROTO
JP·3 granted patents·5 citations·filing 2011–2013
Top patents by PatentIndex Score
3 records- 0170US9229018B2Sample analyzer and sample analyzing methodTOYOSHIMA HIROTO·Filed 2011·Granted Jan 5, 2016·4 cites·13 claims
- 0260US9285383B2Specimen analyzerTOYOSHIMA HIROTO·Filed 2013·Granted Mar 15, 2016·1 cites·12 claims
- 0340US10107829B2Analyzer and analyzing methodTOYOSHIMA HIROTO·Filed 2011·Granted Oct 23, 2018·0 cites·14 claims
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