Assignee
TOUCHDOWN TECHNOLOGIES INC
US·22 granted patents·6 pending applications·243 citations·filing 2002–2010
Top patents by PatentIndex Score
28 records- 0194US7180316B1Probe head with machined mounting pads and method of forming sameTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Granted Feb 20, 2007·27 cites·31 claims
- 0292US7271022B2Process for forming microstructuresTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Sep 18, 2007·33 cites·31 claims
- 0392US7245135B2Post and tip design for a probe contactTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Jul 17, 2007·23 cites·26 claims
- 0490US7365553B2Probe card assemblyTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Apr 29, 2008·15 cites·40 claims
- 0590US7264984B2Process for forming MEMSTOUCHDOWN TECHNOLOGIES INC·Filed 2004·Granted Sep 4, 2007·60 cites·36 claims
- 0684US7759952B2Method of forming probe card assemblyTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Jul 20, 2010·8 cites·12 claims
- 0782US7589547B2Forked probe for testing semiconductor devicesTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Sep 15, 2009·12 cites·24 claims
- 0880US7589542B2Hybrid probe for testing semiconductor devicesTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Sep 15, 2009·9 cites·28 claims
- 0979US7362119B2Torsion spring probe contactor designTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Apr 22, 2008·9 cites·46 claims
- 1076US7791361B2Planarizing probe cardTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Sep 7, 2010·13 cites·10 claims
- 1175US7355422B2Optically enhanced probe alignmentTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Granted Apr 8, 2008·7 cites·23 claims
- 1274US7692436B2Probe card substrate with bonded viaTOUCHDOWN TECHNOLOGIES INC·Filed 2008·Granted Apr 6, 2010·6 cites·19 claims
- 1374US7378734B2Stacked contact bumpTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Granted May 27, 2008·10 cites·21 claims
- 1469US7728612B2Probe card assembly and method of forming sameTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Jun 1, 2010·2 cites·34 claims
- 1567US7724010B2Torsion spring probe contactor designTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted May 25, 2010·4 cites·21 claims
- 1654US7759951B2Semiconductor testing device with elastomer interposerTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Jul 20, 2010·2 cites·4 claims
- 1750US7761966B2Method for repairing a microelectromechanical systemTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Jul 27, 2010·1 cites·6 claims
- 1850US7538567B2Probe card with balanced lateral forceTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Granted May 26, 2009·2 cites·10 claims
- 1947US2010308854A1Probe card substrate with bonded viaTOUCHDOWN TECHNOLOGIES INC·Filed 2010·Application pending·0 cites
- 2047US2008228301A1System to optimize a semiconductor probe cardTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Application pending·0 cites
- 2143US7922888B2Post and tip design for a probe contactTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Apr 12, 2011·0 cites·14 claims
- 2242US7365551B2Excess overdrive detector for probe cardsTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Granted Apr 29, 2008·0 cites·6 claims
- 2341US7772859B2Probe for testing semiconductor devices with features that increase stress toleranceTOUCHDOWN TECHNOLOGIES INC·Filed 2008·Granted Aug 10, 2010·0 cites·29 claims
- 2439US2009072851A1Multi-Pivot Probe Card For Testing Semiconductor DevicesTOUCHDOWN TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 2537US2007057685A1Lateral interposer contact design and probe card assemblyTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Application pending·0 cites
- 2637US2007202683A1Stacked contact bumpTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Application pending·0 cites
- 2734US2007075717A1Lateral interposer contact design and probe card assemblyTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Application pending·0 cites
- 2825US6970616B2Optical cross-connect assemblyTOUCHDOWN TECHNOLOGIES INC·Filed 2002·Granted Nov 29, 2005·0 cites·21 claims
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