Assignee
TOSHIBA ENGINEERING CORP
JP·8 granted patents·115 citations·filing 1996–2000
Top patents by PatentIndex Score
8 records- 0170US6535621B1Defect integrated processing apparatus and method thereofTOSHIBA ENGINEERING CORP·Filed 1999·Granted Mar 18, 2003·35 cites·21 claims
- 0265US6335982B1Method and apparatus for inspecting streakTOSHIBA ENGINEERING CORP·Filed 2000·Granted Jan 1, 2002·11 cites·5 claims
- 0353US6023334AMethod and apparatus for detecting minute irregularities on the surface of an objectTOSHIBA ENGINEERING CORP·Filed 1999·Granted Feb 8, 2000·14 cites·19 claims
- 0449US6208417B1Method and apparatus for detecting minute irregularities on the surface of an objectTOSHIBA ENGINEERING CORP·Filed 1999·Granted Mar 27, 2001·12 cites·28 claims
- 0546US6614918B1Apparatus for inspecting light-and-shade portions and method thereofTOSHIBA ENGINEERING CORP·Filed 1999·Granted Sep 2, 2003·11 cites·23 claims
- 0642US5929996AMethod and apparatus for detecting minute irregularities on the surface of an objectTOSHIBA ENGINEERING CORP·Filed 1996·Granted Jul 27, 1999·12 cites·11 claims
- 0735US6110123ARegion-of-interest setting apparatus for respiration monitoring and a respiration monitoring systemTOSHIBA ENGINEERING CORP·Filed 1998·Granted Aug 29, 2000·18 cites·20 claims
- 0831US6570607B1Light and shade inspecting apparatus and light and shade inspecting methodTOSHIBA ENGINEERING CORP·Filed 1999·Granted May 27, 2003·2 cites·23 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →