Assignee
TOPWAVE INSTR OY
FI·2 granted patents·38 citations·filing 1982–1983
Top patents by PatentIndex Score
2 records- 0165US4490612AMethod for the measurement of the properties of a plastic film by means of infra-red radiationTOPWAVE INSTR OY·Filed 1982·Granted Dec 25, 1984·26 cites·18 claims
- 0245US4647205AMethod and interferometer for the measurement of short distancesTOPWAVE INSTR OY·Filed 1983·Granted Mar 3, 1987·12 cites·2 claims
Join the waitlist — get patent alerts
Get an alert when TOPWAVE INSTR OY files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →