Assignee
TECHNOPROBE SPA
IT·52 granted patents·15 pending applications·70 citations·filing 2004–2025
Top patents by PatentIndex Score
67 records- 0195US11131690B2Contact probe for testing headTECHNOPROBE SPA·Filed 2017·Granted Sep 28, 2021·15 cites·29 claims
- 0292US11035885B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2019·Granted Jun 15, 2021·4 cites·23 claims
- 0391US11867723B2Vertical probe head having an improved contact with a device under testTECHNOPROBE SPA·Filed 2021·Granted Jan 9, 2024·2 cites·10 claims
- 0491US11307221B2Cantilever contact probe and corresponding probe headTECHNOPROBE SPA·Filed 2020·Granted Apr 19, 2022·4 cites·22 claims
- 0586US11971449B2Probe head for a testing apparatus of electronic devices with enhanced filtering propertiesTECHNOPROBE SPA·Filed 2021·Granted Apr 30, 2024·1 cites·27 claims
- 0685US12487253B2Large probe head for testing electronic devices and related manufacturing methodTECHNOPROBE SPA·Filed 2021·Granted Dec 2, 2025·1 cites·16 claims
- 0785US12313655B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2024·Granted May 27, 2025·0 cites·16 claims
- 0885US12032003B2Probe head for electronic devices and corresponding probe cardTECHNOPROBE SPA·Filed 2022·Granted Jul 9, 2024·1 cites·9 claims
- 0984US11828774B2Testing head with improved frequency propertyTECHNOPROBE SPA·Filed 2019·Granted Nov 28, 2023·2 cites·25 claims
- 1084US11293941B2Interface element for a testing apparatus of electronic devices and corresponding manufacturing methodTECHNOPROBE SPA·Filed 2020·Granted Apr 5, 2022·2 cites·16 claims
- 1184US11209463B2Probe card for a testing apparatus of electronic devicesTECHNOPROBE SPA·Filed 2019·Granted Dec 28, 2021·3 cites·26 claims
- 1284US10578646B2Testing head comprising vertical probes with internal openingsTECHNOPROBE SPA·Filed 2017·Granted Mar 3, 2020·6 cites·35 claims
- 1384US10386388B2Contact probe and corresponding testing headTECHNOPROBE SPA·Filed 2017·Granted Aug 20, 2019·4 cites·30 claims
- 1484US2025258199A1Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2025·Application pending·0 cites
- 1583US11782075B2Probe card for a testing apparatus of electronic devicesTECHNOPROBE SPA·Filed 2021·Granted Oct 10, 2023·1 cites·22 claims
- 1682US11921133B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2023·Granted Mar 5, 2024·0 cites·30 claims
- 1782US10551433B2Testing head comprising vertical probesTECHNOPROBE SPA·Filed 2017·Granted Feb 4, 2020·4 cites·41 claims
- 1880US10782319B2Probe card for electronics devicesTECHNOPROBE SPA·Filed 2018·Granted Sep 22, 2020·2 cites·6 claims
- 1979US11029336B2Probe card for high-frequency applicationsTECHNOPROBE SPA·Filed 2019·Granted Jun 8, 2021·2 cites·25 claims
- 2077US11402428B2High-performance probe card in high-frequencyTECHNOPROBE SPA·Filed 2020·Granted Aug 2, 2022·1 cites·19 claims
- 2175US11307222B2Contact probe for a testing head for testing electronic devicesTECHNOPROBE SPA·Filed 2020·Granted Apr 19, 2022·2 cites·15 claims
- 2275US2023324438A1Testing head with improved frequency propertyTECHNOPROBE SPA·Filed 2023·Application pending·0 cites
- 2374US11808788B2Testing head having improved frequency propertiesTECHNOPROBE SPA·Filed 2021·Granted Nov 7, 2023·0 cites·25 claims
- 2470US11442080B2Contact probe and relative probe head of an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2021·Granted Sep 13, 2022·0 cites·20 claims
- 2568US10761113B2Probe card for a testing apparatus of electronic devices with enhanced filtering propertiesTECHNOPROBE SPA·Filed 2017·Granted Sep 1, 2020·1 cites·26 claims
- 2668US10698003B2Testing head comprising vertical probes for reduced pitch applicationsTECHNOPROBE SPA·Filed 2017·Granted Jun 30, 2020·2 cites·30 claims
- 2764US11163004B2Probe head for a testing apparatus of electronic devices with enhanced filtering propertiesTECHNOPROBE SPA·Filed 2019·Granted Nov 2, 2021·0 cites·2 claims
- 2864US11016122B2Contact probe and relative probe head of an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2019·Granted May 25, 2021·0 cites·23 claims
- 2960US12259407B2Contact probe for probe heads of electronic devicesTECHNOPROBE SPA·Filed 2021·Granted Mar 25, 2025·0 cites·25 claims
- 3060US2022155344A1Manufacturing method for manufacturing contact probes for probe heads of electronic devices and corresponding contact probeTECHNOPROBE SPA·Filed 2022·Application pending·0 cites
- 3159US7301354B2Contact probe for a testing head having vertical probes for semiconductor integrated devicesTECHNOPROBE SPA·Filed 2004·Granted Nov 27, 2007·9 cites·42 claims
- 3258US10228392B2Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Granted Mar 12, 2019·1 cites·36 claims
- 3356US12571838B2Probe head for testing electronic devices comprising integrated optical elementsTECHNOPROBE SPA·Filed 2021·Granted Mar 10, 2026·0 cites·19 claims
- 3455US12292457B2Flexible membrane adapted to carry high-frequency (RF) power signals and corresponding probe card for the high-frequency (RF) power test of electronic devicesTECHNOPROBE SPA·Filed 2021·Granted May 6, 2025·0 cites·33 claims
- 3555US2025334610A1Probe card for a testing apparatus of electronic devices and corresponding space transformerTECHNOPROBE SPA·Filed 2023·Application pending·0 cites
- 3654US12455299B2Contact element for a probe head for testing high-frequency electronic devices and relating probe headTECHNOPROBE SPA·Filed 2021·Granted Oct 28, 2025·0 cites·20 claims
- 3753US10365299B2Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished productTECHNOPROBE SPA·Filed 2017·Granted Jul 30, 2019·0 cites·35 claims
- 3853US2017269125A1Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Application pending·0 cites
- 3951US10401387B2Manufacturing method of contact probes for a testing headTECHNOPROBE SPA·Filed 2017·Granted Sep 3, 2019·0 cites·28 claims
- 4050US11953522B2Probe head for reduced-pitch applicationsTECHNOPROBE SPA·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
- 4150US11112431B2Probe card for high-frequency applicationsTECHNOPROBE SPA·Filed 2019·Granted Sep 7, 2021·0 cites·23 claims
- 4249US12044703B2Contact probe for high-frequency applications with improved current capacityTECHNOPROBE SPA·Filed 2020·Granted Jul 23, 2024·0 cites·14 claims
- 4349US11029337B2Vertical probe testing head with improved frequency propertiesTECHNOPROBE SPA·Filed 2019·Granted Jun 8, 2021·0 cites·28 claims
- 4449US2024012028A1Large probe card for testing electronic devices and related manufacturing methodTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 4549US2022155349A1Vertical Probe HeadTECHNOPROBE SPA·Filed 2022·Application pending·0 cites
- 4649US2025052783A1Contact probe for probe heads of electronic devices and corresponding probe headTECHNOPROBE SPA·Filed 2022·Application pending·0 cites
- 4748US12105118B2Testing head with an improved contact between contact probes and guide holesTECHNOPROBE SPA·Filed 2020·Granted Oct 1, 2024·0 cites·15 claims
- 4848US12085588B2Vertical probe head with improved contact properties towards a device under testTECHNOPROBE SPA·Filed 2021·Granted Sep 10, 2024·0 cites·6 claims
- 4948US2024044940A1Contact probe for probe heads of electronic devicesTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 5047US9880202B2Probe card for an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2014·Granted Jan 30, 2018·0 cites·34 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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