Assignee
SEMICONDUCTOR INSIGHTS INC
CA·19 granted patents·3 pending applications·408 citations·filing 1995–2012
Top patents by PatentIndex Score
22 records- 0195US7580557B2Method of design analysis of existing integrated circuitsSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Aug 25, 2009·44 cites·2 claims
- 0293US7643665B2Method of design analysis of existing integrated circuitsSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Jan 5, 2010·49 cites·12 claims
- 0385US7693348B2Method of registering and aligning multiple imagesSEMICONDUCTOR INSIGHTS INC·Filed 2005·Granted Apr 6, 2010·26 cites·41 claims
- 0482US7013028B2Advanced schematic editorSEMICONDUCTOR INSIGHTS INC·Filed 2001·Granted Mar 14, 2006·38 cites·17 claims
- 0581US9534299B2Method and system for ion beam delayering of a sample and control thereofSEMICONDUCTOR INSIGHTS INC·Filed 2012·Granted Jan 3, 2017·4 cites·9 claims
- 0678US5694481AAutomated design analysis system for generating circuit schematics from high magnification images of an integrated circuitSEMICONDUCTOR INSIGHTS INC·Filed 1995·Granted Dec 2, 1997·103 cites·47 claims
- 0776US6907583B2Computer aided method of circuit extractionSEMICONDUCTOR INSIGHTS INC·Filed 2002·Granted Jun 14, 2005·24 cites·21 claims
- 0876US6738957B2Schematic organization toolSEMICONDUCTOR INSIGHTS INC·Filed 2001·Granted May 18, 2004·27 cites·11 claims
- 0975US7765517B2Method and apparatus for removing dummy features from a data structureSEMICONDUCTOR INSIGHTS INC·Filed 2007·Granted Jul 27, 2010·6 cites·11 claims
- 1061US8347262B2Method of deriving an integrated circuit schematic diagramSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Jan 1, 2013·2 cites·13 claims
- 1161US7751643B2Method and apparatus for removing uneven brightness in an imageSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Jul 6, 2010·9 cites·22 claims
- 1259US7278121B2Method and apparatus for reducing redundant data in a layout data structureSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Oct 2, 2007·8 cites·39 claims
- 1354US6289116B1Computer-assisted design analysis method for extracting device and interconnect informationSEMICONDUCTOR INSIGHTS INC·Filed 1997·Granted Sep 11, 2001·30 cites·17 claims
- 1452US8051395B2Method of labelling swappable pins for integrated circuit pattern matchingSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Nov 1, 2011·2 cites·10 claims
- 1550US7873203B2Method of design analysis of existing integrated circuitsSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Jan 18, 2011·0 cites·10 claims
- 1649US7207018B2Method and apparatus for locating short circuit faults in an integrated circuit layoutSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Apr 17, 2007·2 cites·16 claims
- 1748US7886258B2Method and apparatus for removing dummy features from a data structureSEMICONDUCTOR INSIGHTS INC·Filed 2010·Granted Feb 8, 2011·0 cites·6 claims
- 1846US6236746B1Method to extract circuit informationSEMICONDUCTOR INSIGHTS INC·Filed 1997·Granted May 22, 2001·34 cites·25 claims
- 1944US7899640B2Integrated circuit characterisation system and methodSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Mar 1, 2011·0 cites·23 claims
- 2043US2008123996A1Method of registering and aligning multiple imagesSEMICONDUCTOR INSIGHTS INC·Filed 2007·Application pending·0 cites
- 2142US2009228518A2Method and System for Patent Claim Management and OrganizationSEMICONDUCTOR INSIGHTS INC·Filed 2007·Application pending·0 cites
- 2239US2002020746A1System and method for optical codingSEMICONDUCTOR INSIGHTS INC·Filed 2001·Application pending·0 cites
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