Assignee
ROUVIERE JEAN-LUC
0 granted patents·2 pending applications·0 citations·filing 2004–2011
Top patents by PatentIndex Score
2 records- 0125US2006288797A1Method for measuring physical parameters of at least one micrometric or nanometric dimensional phase in a composite systemROUVIERE JEAN-LUC·Filed 2004·Application pending·0 cites
- 0217US2013206968A1Method to facilitate positioning of diffraction spotsROUVIERE JEAN-LUC·Filed 2011·Application pending·0 cites
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