Assignee
RAMKUMAR KRISHNASWAMY
US·15 granted patents·333 citations·filing 2002–2012
Top patents by PatentIndex Score
15 records- 0198US8940645B2Radical oxidation process for fabricating a nonvolatile charge trap memory deviceRAMKUMAR KRISHNASWAMY·Filed 2012·Granted Jan 27, 2015·33 cites·20 claims
- 0298US8318608B2Method of fabricating a nonvolatile charge trap memory deviceRAMKUMAR KRISHNASWAMY·Filed 2008·Granted Nov 27, 2012·46 cites·20 claims
- 0398US8283261B2Radical oxidation process for fabricating a nonvolatile charge trap memory deviceRAMKUMAR KRISHNASWAMY·Filed 2008·Granted Oct 9, 2012·46 cites·6 claims
- 0497US8071453B1Method of ONO integration into MOS flowRAMKUMAR KRISHNASWAMY·Filed 2009·Granted Dec 6, 2011·74 cites·24 claims
- 0596US8993453B1Method of fabricating a nonvolatile charge trap memory deviceRAMKUMAR KRISHNASWAMY·Filed 2012·Granted Mar 31, 2015·17 cites·13 claims
- 0696US8679927B2Integration of non-volatile charge trap memory devices and logic CMOS devicesRAMKUMAR KRISHNASWAMY·Filed 2008·Granted Mar 25, 2014·31 cites·16 claims
- 0796US8143129B2Integration of non-volatile charge trap memory devices and logic CMOS devicesRAMKUMAR KRISHNASWAMY·Filed 2008·Granted Mar 27, 2012·50 cites·11 claims
- 0891US8871595B2Integration of non-volatile charge trap memory devices and logic CMOS devicesRAMKUMAR KRISHNASWAMY·Filed 2012·Granted Oct 28, 2014·13 cites·20 claims
- 0991US8685813B2Method of integrating a charge-trapping gate stack into a CMOS flowRAMKUMAR KRISHNASWAMY·Filed 2012·Granted Apr 1, 2014·8 cites·18 claims
- 1081US9023707B1Simultaneously forming a dielectric layer in MOS and ONO device regionsRAMKUMAR KRISHNASWAMY·Filed 2011·Granted May 5, 2015·5 cites·10 claims
- 1177US8445381B2Oxide-nitride stack gate dielectricRAMKUMAR KRISHNASWAMY·Filed 2007·Granted May 21, 2013·4 cites·8 claims
- 1272US8088683B2Sequential deposition and anneal of a dielectic layer in a charge trapping memory deviceRAMKUMAR KRISHNASWAMY·Filed 2008·Granted Jan 3, 2012·3 cites·17 claims
- 1369US9102522B2Method of ONO integration into logic CMOS flowRAMKUMAR KRISHNASWAMY·Filed 2012·Granted Aug 11, 2015·1 cites·13 claims
- 1451US8536640B2Deuterated film encapsulation of nonvolatile charge trap memory deviceRAMKUMAR KRISHNASWAMY·Filed 2007·Granted Sep 17, 2013·0 cites·14 claims
- 1548US6969689B1Method of manufacturing an oxide-nitride-oxide (ONO) dielectric for SONOS-type devicesRAMKUMAR KRISHNASWAMY·Filed 2002·Granted Nov 29, 2005·2 cites·18 claims
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