Assignee
PARAMETRIC TECH CORP
US·20 granted patents·3 pending applications·727 citations·filing 1994–2013
Top patents by PatentIndex Score
23 records- 0191US5592597AReal-time image generation system for simulating physical paint, drawing media, and feature modeling with 3-D graphicsPARAMETRIC TECH CORP·Filed 1994·Granted Jan 7, 1997·159 cites·12 claims
- 0288US5687304AReal-time image generation system for simulating physical paint, drawing media, and feature modeling with 3-D graphicsPARAMETRIC TECH CORP·Filed 1996·Granted Nov 11, 1997·151 cites·7 claims
- 0383US6447223B1Control for high speed cutting toolPARAMETRIC TECH CORP·Filed 2000·Granted Sep 10, 2002·64 cites·28 claims
- 0480US8352297B1Supply chain managementPARAMETRIC TECH CORP·Filed 2009·Granted Jan 8, 2013·9 cites·9 claims
- 0579US5838331AComputer graphics system for creating and enhancing texture mapsPARAMETRIC TECH CORP·Filed 1997·Granted Nov 17, 1998·81 cites·11 claims
- 0675US7013468B2Method and apparatus for design and manufacturing application associative interoperabilityPARAMETRIC TECH CORP·Filed 2002·Granted Mar 14, 2006·34 cites·36 claims
- 0770US7574329B1Object model for decision and issue trackingPARAMETRIC TECH CORP·Filed 2000·Granted Aug 11, 2009·19 cites·15 claims
- 0867US6545676B1Method and system for creating a tessellated approximation of an outer envelope of a complex modelPARAMETRIC TECH CORP·Filed 1999·Granted Apr 8, 2003·48 cites·19 claims
- 0963US7529773B2Idea service for automatic file naming and storingPARAMETRIC TECH CORP·Filed 2002·Granted May 5, 2009·9 cites·39 claims
- 1061US7529763B2System and method for providing dynamic client architecture in an application development environmentPARAMETRIC TECH CORP·Filed 2002·Granted May 5, 2009·17 cites·19 claims
- 1161US6625607B1Method of comparing partsPARAMETRIC TECH CORP·Filed 2000·Granted Sep 23, 2003·24 cites·16 claims
- 1257US7661101B2Synchronous and asynchronous collaboration between heterogeneous applicationsPARAMETRIC TECH CORP·Filed 2004·Granted Feb 9, 2010·16 cites·24 claims
- 1351US7464007B2Flexible object representationPARAMETRIC TECH CORP·Filed 2003·Granted Dec 9, 2008·5 cites·52 claims
- 1445US6665569B1Method and system for dynamically updating geometric modelsPARAMETRIC TECH CORP·Filed 2000·Granted Dec 16, 2003·2 cites·15 claims
- 1543US5680523ASystems and methods for developing three-dimensional data through the identification of curves on a perspective sketchPARAMETRIC TECH CORP·Filed 1996·Granted Oct 21, 1997·24 cites·28 claims
- 1641US7006956B1Integration of an analysis into the features of a model of an objectPARAMETRIC TECH CORP·Filed 1999·Granted Feb 28, 2006·17 cites·26 claims
- 1737US7013246B1Parametric exchange of data between a modeling system and an external application programPARAMETRIC TECH CORP·Filed 1999·Granted Mar 14, 2006·13 cites·19 claims
- 1837US6608623B1Feature-based macro language for definition of customized analytic and customized geometric functionalityPARAMETRIC TECH CORP·Filed 1999·Granted Aug 19, 2003·13 cites·73 claims
- 1936US6473673B1Method and system for management of heterogeneous assembliesPARAMETRIC TECH CORP·Filed 1999·Granted Oct 29, 2002·15 cites·24 claims
- 2036US2013325413A1Results-based tool selection, diagnosis, and help system for a feature-based modeling environmentPARAMETRIC TECH CORP·Filed 2013·Application pending·0 cites
- 2132US6580428B1Method and system for identifying peripheral elements of a complex modelPARAMETRIC TECH CORP·Filed 1999·Granted Jun 17, 2003·7 cites·11 claims
- 2228US2003160779A1Method and apparatus for managing solid model feature history and changesPARAMETRIC TECH CORP·Filed 2002·Application pending·0 cites
- 2328US2003163604A1Method and apparatus for design and manufacturing application feature interoperabilityPARAMETRIC TECH CORP·Filed 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when PARAMETRIC TECH CORP files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →