Assignee
OPTIMAL TEST LTD
IL·1 granted patent·2 pending applications·8 citations·filing 2006–2008
Top patents by PatentIndex Score
3 records- 0178US7528622B2Methods for slow test time detection of an integrated circuit during parallel testingOPTIMAL TEST LTD·Filed 2006·Granted May 5, 2009·8 cites·14 claims
- 0239US2008114558A1Augmenting semiconductor's devices quality and reliabilityOPTIMAL TEST LTD·Filed 2008·Application pending·0 cites
- 0337US2009013218A1Datalog management in semiconductor testingOPTIMAL TEST LTD·Filed 2007·Application pending·0 cites
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