Assignee
OKADA SATOSHI
JP·9 granted patents·2 pending applications·22 citations·filing 2009–2012
Top patents by PatentIndex Score
11 records- 0185US9428692B2Oxygen absorbent composition and oxygen absorbent package using the sameOKADA SATOSHI·Filed 2012·Granted Aug 30, 2016·5 cites·17 claims
- 0272US8227281B2Manufacture method for ZnO-based light emitting deviceOKADA SATOSHI·Filed 2010·Granted Jul 24, 2012·3 cites·18 claims
- 0369US8950987B2Method of boring work by 5-axis machining double-housing machine tool and 5-axis machining double-housing machine toolOKADA SATOSHI·Filed 2009·Granted Feb 10, 2015·9 cites·5 claims
- 0467US8092711B2Liquid crystal compound, polymerizable liquid crystal composition, optically anisotropic material, optical element and optical information writing/reading deviceOKADA SATOSHI·Filed 2010·Granted Jan 10, 2012·1 cites·8 claims
- 0565US8563939B2Radiation detecting apparatus and radiation detecting systemOKADA SATOSHI·Filed 2009·Granted Oct 22, 2013·2 cites·19 claims
- 0660US8264339B2Alarm management apparatusOKADA SATOSHI·Filed 2009·Granted Sep 11, 2012·2 cites·8 claims
- 0744US8488432B2Polymer compound, composition for alignment film, alignment film, optical element, and optical information writing/reading deviceOKADA SATOSHI·Filed 2012·Granted Jul 16, 2013·0 cites·12 claims
- 0844US2014003540A1Data readout device, data readout method, and programOKADA SATOSHI·Filed 2012·Application pending·0 cites
- 0942US8420854B2Di(meth)acrylate compound, polymerizable liquid crystal composition, optical anisotropic material, optical element and optical information writing/reading deviceOKADA SATOSHI·Filed 2012·Granted Apr 16, 2013·0 cites·17 claims
- 1042US2012219115A1Radiation imaging apparatus and radiation detection systemOKADA SATOSHI·Filed 2012·Application pending·0 cites
- 1138US8293134B2Optically anisotropic material, optical element and optical information writing/reading deviceOKADA SATOSHI·Filed 2010·Granted Oct 23, 2012·0 cites·12 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →