Assignee
OISHI SATORU
JP·3 granted patents·1 pending application·0 citations·filing 2005–2011
Top patents by PatentIndex Score
4 records- 0148US2006106566A1Position detecting method and apparatusOISHI SATORU·Filed 2005·Application pending·0 cites
- 0247US8532366B2Position detecting methodOISHI SATORU·Filed 2011·Granted Sep 10, 2013·0 cites·13 claims
- 0346US8976337B2Method of measuring mark position and measuring apparatusOISHI SATORU·Filed 2011·Granted Mar 10, 2015·0 cites·12 claims
- 0445US8097473B2Alignment method, exposure method, pattern forming method, and exposure apparatusOISHI SATORU·Filed 2008·Granted Jan 17, 2012·0 cites·17 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →