Assignee
OGAWA RYUJI
JP·2 granted patents·2 pending applications·13 citations·filing 2006–2011
Top patents by PatentIndex Score
4 records- 0187US8127265B2Pattern verification method, program thereof, and manufacturing method of semiconductor deviceOGAWA RYUJI·Filed 2011·Granted Feb 28, 2012·5 cites·4 claims
- 0283US8234596B2Pattern data creating method, pattern data creating program, and semiconductor device manufacturing methodOGAWA RYUJI·Filed 2009·Granted Jul 31, 2012·8 cites·15 claims
- 0350US2007050741A1Pattern verification method, program thereof, and manufacturing method of semiconductor deviceOGAWA RYUJI·Filed 2006·Application pending·0 cites
- 0440US2006206847A1Layout optimizing method for a semiconductor device, manufacturing method of a photomask, a manufacturing method for a semiconductor device, and computer program productOGAWA RYUJI·Filed 2006·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →