Assignee
NOJIMA SHIGEKI
JP·3 granted patents·2 pending applications·3 citations·filing 2005–2011
Top patents by PatentIndex Score
5 records- 0173US8402407B2Semiconductor integrated circuit pattern verification method, photomask manufacturing method, semiconductor integrated circuit device manufacturing method, and program for implementing semiconductor integrated circuit pattern verification methodNOJIMA SHIGEKI·Filed 2011·Granted Mar 19, 2013·3 cites·7 claims
- 0239US8885949B2Pattern shape determining method, pattern shape verifying method, and pattern correcting methodNOJIMA SHIGEKI·Filed 2011·Granted Nov 11, 2014·0 cites·17 claims
- 0338US2006039596A1Pattern measuring method, pattern measuring apparatus, photo mask manufacturing method, semiconductor device manufacturing method, and computer program productNOJIMA SHIGEKI·Filed 2005·Application pending·0 cites
- 0434US8336004B2Dimension assurance of mask using plurality of types of pattern ambient environmentNOJIMA SHIGEKI·Filed 2011·Granted Dec 18, 2012·0 cites·20 claims
- 0533US2011029938A1Pattern creating method, computer program product, and method of manufacturing semiconductor deviceNOJIMA SHIGEKI·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when NOJIMA SHIGEKI files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →