Assignee
NIEH CHUN-FENG
TW·5 granted patents·2 pending applications·17 citations·filing 2006–2012
Top patents by PatentIndex Score
7 records- 0187US8569139B2Method of manufacturing strained source/drain structuresNIEH CHUN-FENG·Filed 2010·Granted Oct 29, 2013·8 cites·20 claims
- 0278US8629037B2Forming a protective film on a back side of a silicon wafer in a III-V family fabrication processNIEH CHUN-FENG·Filed 2011·Granted Jan 14, 2014·5 cites·18 claims
- 0374US8629013B2Junction leakage reduction through implantationNIEH CHUN-FENG·Filed 2011·Granted Jan 14, 2014·3 cites·18 claims
- 0461US10128115B2Method of forming ultra-shallow junctions in semiconductor devicesNIEH CHUN FENG·Filed 2010·Granted Nov 13, 2018·1 cites·20 claims
- 0552US8212253B2Shallow junction formation and high dopant activation rate of MOS devicesNIEH CHUN-FENG·Filed 2011·Granted Jul 3, 2012·0 cites·20 claims
- 0642US2007298557A1Junction leakage reduction in SiGe process by tilt implantationNIEH CHUN-FENG·Filed 2006·Application pending·0 cites
- 0740US2013137238A1Method for forming high mobility channels in iii-v family channel devicesNIEH CHUN-FENG·Filed 2012·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →