Assignee
NI CHENG-CHIN
TW·1 granted patent·2 pending applications·2 citations·filing 2007–2009
Top patents by PatentIndex Score
3 records- 0141US8248090B2ZIF connectors and semiconductor testing device and system using the sameNI CHENG-CHIN·Filed 2009·Granted Aug 21, 2012·2 cites·5 claims
- 0235US2009108862A1Testing system moduleNI CHENG-CHIN·Filed 2008·Application pending·0 cites
- 0334US2009093987A1Method for accurate measuring stray capacitance of automatic test equipment and system thereofNI CHENG-CHIN·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →