Assignee

NEOSEM INC

KR·1 granted patent·6 citations·filing 2015–2015

Technology mixG01R1 G06F1 G11C1

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0180US9626264B2Memory device test apparatus and method having multiple memory devices connected to downstream ports of a PCI express switch at the same timeNEOSEM INC·Filed 2015·Granted Apr 18, 2017·6 cites·11 claims

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