Assignee
NANOSEEX INC
TW·0 granted patents·8 pending applications·0 citations·filing 2024–2025
Top patents by PatentIndex Score
8 records- 0162US2026009749A1X-ray measurement system and x-ray measurement methodNANOSEEX INC·Filed 2025·Application pending·0 cites
- 0261US2025327762A1Composite semiconductor inspection systemNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0358US2025341480A1X-ray measurement system and x-ray measurement methodNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0457US2025147195A1X-ray measurement system with high signal resolutionNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0548US2025334530A1X-ray reflection analysis system applying multiple x-ray beamsNANOSEEX INC·Filed 2025·Application pending·0 cites
- 0648US2026086049A1X-ray measurment system and composite semiconductor inspection systemNANOSEEX INC·Filed 2025·Application pending·0 cites
- 0748US2025377318A1X-ray reflection analysis system and x-reflection analysis method utilizing multi-order mode signalsNANOSEEX INC·Filed 2025·Application pending·0 cites
- 0845US2026016290A1X-ray fitting analysis method and x-ray fitting analysis system based on multi-physics variable modelNANOSEEX INC·Filed 2025·Application pending·0 cites
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