Assignee
NAKAYAMA YOSHINORI
JP·2 granted patents·1 pending application·10 citations·filing 2006–2011
Top patents by PatentIndex Score
3 records- 0179US8263929B2Standard member for correction, scanning electron microscope using same, and scanning electron microscope correction methodNAKAYAMA YOSHINORI·Filed 2009·Granted Sep 11, 2012·6 cites·20 claims
- 0274US8735816B2Standard member for calibration and method of manufacturing the same and scanning electron microscope using the sameNAKAYAMA YOSHINORI·Filed 2011·Granted May 27, 2014·4 cites·18 claims
- 0337US2007114449A1Standard component for length measurement calibration, method for manufacturing the same, and calibration method and apparatus using the sameNAKAYAMA YOSHINORI·Filed 2006·Application pending·0 cites
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