Assignee
NAKATA YOSHIROU
JP·2 granted patents·6 citations·filing 2010–2010
Technology mixG01R2
Top patents by PatentIndex Score
2 records- 0180US8659312B2Probe card and semiconductor wafer inspection method using the sameNAKATA YOSHIROU·Filed 2010·Granted Feb 25, 2014·6 cites·17 claims
- 0246US8400182B2Wafer inspection device and semiconductor wafer inspection method using the sameNAKATA YOSHIROU·Filed 2010·Granted Mar 19, 2013·0 cites·3 claims
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