Assignee
NAKAIDE MINORU
JP·2 granted patents·4 citations·filing 2011–2011
Technology mixG06F2
Top patents by PatentIndex Score
2 records- 0165US8966320B2Fault inspection unit, central processing unit, and fault inspection methodNAKAIDE MINORU·Filed 2011·Granted Feb 24, 2015·3 cites·5 claims
- 0254US9009579B2Address translation checking device, central processing unit, and address translation checking methodNAKAIDE MINORU·Filed 2011·Granted Apr 14, 2015·1 cites·7 claims
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