Assignee
NAGANO ELECTRONICS IND
2 granted patents·97 citations·filing 1977–1980
Top patents by PatentIndex Score
2 records- 0188US4168437AOptoelectric multi-sensor measuring apparatus and a method for measuring surface flatness therewithNAGANO ELECTRONICS IND·Filed 1977·Granted Sep 18, 1979·47 cites·4 claims
- 0270US4344260AMethod for precision shaping of wafer materialsNAGANO ELECTRONICS IND·Filed 1980·Granted Aug 17, 1982·50 cites·1 claims
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