Assignee
MEYER MORITZ ANDREAS
DE·3 granted patents·0 citations·filing 2007–2011
Top patents by PatentIndex Score
3 records- 0147US8058731B2Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistanceMEYER MORITZ ANDREAS·Filed 2007·Granted Nov 15, 2011·0 cites·13 claims
- 0246US8575029B2Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistanceMEYER MORITZ ANDREAS·Filed 2011·Granted Nov 5, 2013·0 cites·20 claims
- 0343US8058081B2Method of testing an integrity of a material layer in a semiconductor structureMEYER MORITZ ANDREAS·Filed 2007·Granted Nov 15, 2011·0 cites·18 claims
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