Assignee
METEROLOGIC INSTR INC
US·2 granted patents·38 citations·filing 2002–2007
Top patents by PatentIndex Score
2 records- 0191US7546951B2Digital image capture and processing system employing real-time analysis of image exposure quality and the reconfiguration of system control parameters based on the results of such exposure quality analysisMETEROLOGIC INSTR INC·Filed 2007·Granted Jun 16, 2009·15 cites·31 claims
- 0287US7303132B2X-radiation scanning system having an automatic object identification and attribute information acquisition and linking mechanism integrated thereinMETEROLOGIC INSTR INC·Filed 2002·Granted Dec 4, 2007·23 cites·25 claims
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