Assignee
MARENA SYSTEMS CORP
US·4 granted patents·89 citations·filing 2003–2006
Top patents by PatentIndex Score
4 records- 0189US6840666B2Methods and systems employing infrared thermography for defect detection and analysisMARENA SYSTEMS CORP·Filed 2003·Granted Jan 11, 2005·50 cites·19 claims
- 0278US7149343B2Methods for analyzing defect artifacts to precisely locate corresponding defectsMARENA SYSTEMS CORP·Filed 2003·Granted Dec 12, 2006·22 cites·3 claims
- 0373US7538815B1Autofocus system and method using focus measure gradientMARENA SYSTEMS CORP·Filed 2003·Granted May 26, 2009·15 cites·2 claims
- 0455US7551769B2Data structures and algorithms for precise defect location by analyzing artifactsMARENA SYSTEMS CORP·Filed 2006·Granted Jun 23, 2009·2 cites·6 claims
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