Assignee
MAN XIN
JP·2 granted patents·3 citations·filing 2008–2010
Top patents by PatentIndex Score
2 records- 0171US8191168B2Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscopeMAN XIN·Filed 2008·Granted May 29, 2012·3 cites·5 claims
- 0236US8581206B2Focused ion beam system and sample processing method using the sameMAN XIN·Filed 2010·Granted Nov 12, 2013·0 cites·4 claims
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