Assignee
MALTIEL RON
US·2 granted patents·27 citations·filing 1989–1990
Technology mixG01B2
Top patents by PatentIndex Score
2 records- 0150US4956611AElectrical measurements of properties of semiconductor devices during their manufacturing processMALTIEL RON·Filed 1989·Granted Sep 11, 1990·13 cites·14 claims
- 0247US4978923AElectrical measurements of the profile of semiconductor devices during their manufacturing processMALTIEL RON·Filed 1990·Granted Dec 18, 1990·14 cites·4 claims
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