Assignee
LEYBOLD INFICON INC
US·26 granted patents·875 citations·filing 1988–2002
Top patents by PatentIndex Score
26 records- 0187US5112642AMeasuring and controlling deposition on a piezoelectric monitor crystalLEYBOLD INFICON INC·Filed 1990·Granted May 12, 1992·69 cites·8 claims
- 0286US5703359AComposite membrane and support assemblyLEYBOLD INFICON INC·Filed 1996·Granted Dec 30, 1997·147 cites·51 claims
- 0384US5233261ABuffered quartz crystalLEYBOLD INFICON INC·Filed 1991·Granted Aug 3, 1993·45 cites·15 claims
- 0483US5852270AMethod of manufacturing a miniature quadrupole using electrode-discharge machiningLEYBOLD INFICON INC·Filed 1997·Granted Dec 22, 1998·45 cites·6 claims
- 0579US5528924AAcoustic tool for analysis of a gaseous substanceLEYBOLD INFICON INC·Filed 1993·Granted Jun 25, 1996·53 cites·22 claims
- 0679US5104513AGas sensorLEYBOLD INFICON INC·Filed 1990·Granted Apr 14, 1992·57 cites·12 claims
- 0778US5524477AQuantitative determination of air present in refrigerant sample by measurement of pressure coefficient of resonance frequencyLEYBOLD INFICON INC·Filed 1994·Granted Jun 11, 1996·51 cites·5 claims
- 0876US5426300APortable GCMS system using getter pumpLEYBOLD INFICON INC·Filed 1993·Granted Jun 20, 1995·32 cites·21 claims
- 0975US6091068AIon collector assemblyLEYBOLD INFICON INC·Filed 1998·Granted Jul 18, 2000·36 cites·11 claims
- 1075US5768937AAcoustic sensor for in-line continuous monitoring of gassesLEYBOLD INFICON INC·Filed 1996·Granted Jun 23, 1998·58 cites·22 claims
- 1174USRE38138EMethod for linearization of ion currents in a quadrupole mass analyzerLEYBOLD INFICON INC·Filed 2000·Granted Jun 10, 2003·10 cites·10 claims
- 1272US5117192AControl circuitry for quartz crystal deposition monitorLEYBOLD INFICON INC·Filed 1990·Granted May 26, 1992·40 cites·7 claims
- 1370US5889281AMethod for linearization of ion currents in a quadrupole mass analyzerLEYBOLD INFICON INC·Filed 1997·Granted Mar 30, 1999·21 cites·6 claims
- 1470US5808308ADual ion sourceLEYBOLD INFICON INC·Filed 1997·Granted Sep 15, 1998·24 cites·7 claims
- 1568US5850084AIon lens assembly for gas analysis systemLEYBOLD INFICON INC·Filed 1997·Granted Dec 15, 1998·22 cites·18 claims
- 1665US5025664AMultiple crystal head for deposition thickness monitorLEYBOLD INFICON INC·Filed 1989·Granted Jun 25, 1991·24 cites·17 claims
- 1760US5948983AWall deposition monitoring systemLEYBOLD INFICON INC·Filed 1998·Granted Sep 7, 1999·30 cites·8 claims
- 1857US5233190AFourier transform molecular spectrometerLEYBOLD INFICON INC·Filed 1991·Granted Aug 3, 1993·19 cites·14 claims
- 1955US5834770AIon collecting electrode for total pressure collectorLEYBOLD INFICON INC·Filed 1997·Granted Nov 10, 1998·12 cites·13 claims
- 2055US4952802AIon detection apparatusLEYBOLD INFICON INC·Filed 1988·Granted Aug 28, 1990·10 cites·13 claims
- 2154US6468814B1Detection of nontransient processing anomalies in vacuum manufacturing processLEYBOLD INFICON INC·Filed 1999·Granted Oct 22, 2002·20 cites·5 claims
- 2253US6740195B2Detection of nontransient processing anomalies in vacuum manufacturing processLEYBOLD INFICON INC·Filed 2002·Granted May 25, 2004·5 cites·13 claims
- 2352US5284569AMiniature gas sensorLEYBOLD INFICON INC·Filed 1991·Granted Feb 8, 1994·19 cites·9 claims
- 2450US4988871AGas partial pressure sensor for vacuum chamberLEYBOLD INFICON INC·Filed 1989·Granted Jan 29, 1991·14 cites·11 claims
- 2538US6482649B1Acoustic consumption monitorLEYBOLD INFICON INC·Filed 1999·Granted Nov 19, 2002·6 cites·6 claims
- 2637US5401298ASorption pumpLEYBOLD INFICON INC·Filed 1993·Granted Mar 28, 1995·6 cites·8 claims
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